We are looking for a quote for a research-grade Atomic Force Microscope system delivered, installed, and set up at Grambling State University, 407 Central Ave.
System: Complete AFM/SPM system for high-resolution nanomaterial imaging with sub-nanometer resolution
Modes: Contact, tapping/intermittent, non-contact, LFM, phase imaging, force spectroscopy, force volume mapping, MFM, EFM, PFM, KPFM, FMM, nanoindentation, SECCM, SICM, STM, IV, and CV
Sample Capacity: Up to 50 x 50 x 20 mm and 500 g, with motorized XY and Z stages
Included Components: AFM head, controller, PC, software, dual 32-inch 4K monitors, active vibration isolation, acoustic enclosure, liquid imaging accessories, conductive AFM module, cantilevers, hardware, and accessories
Requirements: New current-production equipment, complete turnkey pricing including delivery, installation, setup, testing, and training/support details if available
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